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Direct strain and elastic energy evaluation in rolled-up semiconductor tubes by x-ray microdiffraction

Direct strain and elastic energy evaluation in rolled-up semiconductor tubes by x-ray microdiffraction
Authors:

A. Malachias, C. Deneke, B. Krause, C. Mocuta, S. Kiravittaya, T. H. Metzger, O. G. Schmidt 

Source:

Physical Review B 79 (3), 035301 

Date: 2009