Home | Legals | Sitemap | KIT

Monitoring the thin film formation during sputter deposition of vanadium carbide

Monitoring the thin film formation during sputter deposition of vanadium carbide
Authors:

M. Kaufholz, B. Krause, S. Kotapati, M. Köhl, M.F. Mantilla, M. Stüber, S. Ulrich, R. Schneider, D. Gerthsen and T. Baumbach

Source:

J. Synchrotron Rad. (2015). 22, 76–85

Date: 2015