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Copper tracing to determine the micrometric electronic properties of a thick ferrous corrosion layer formed in an anoxic medium

Copper tracing to determine the micrometric electronic properties of a thick ferrous corrosion layer formed in an anoxic medium
Authors:

M. Saheb, D. Neff, C. Bataillon, E. Foy, P. Dillmann 

Source:

Corrosion Science 53 (2011) 2201-2207 

Date: 2011