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Philipp Schroth

Philipp Schroth

PhD Students
Molecular beam epitaxy and X-ray scattering
Focus of research: : III/V Nanowires – Growth dynamics and Polytypism in self-catalyzed GaAs Nanowires grown on Silicon
philipp schrothXvl7βˆ‚kit edu

Group: Nanocharacterization

Dipl.-Phys. Philipp Schroth

Research interests

  • MBE growth of III/V nanowires and III/V quantum dots

  • Polytypism in III/V nanowires

  • X-ray diffraction of nanostructures

  • FEM calculations of material specific strains in epitaxial semiconductor nanostructures

Professionel Curriculum

since 2011 KIT


2011 Diplom at KIT

Winner of the "YIN Poster Award 2013"

Title: In-situ monitoring of the growth process of self-catalyzed GaAs nanowires on Si (111) with X-ray diffraction P. Schroth, M. Köhl, E. Dimakis, C. Somaschini, L. Geelhaar, J.-W. Hornung, S. Lazarev, S. Bauer, A. Biermanns, U. Pietsch, and T. Baumbach

Author Title Source Date

Köhl, M., Schroth, P., Minkevich, A. A., Hornung, J.-W., Dimakis, E., Somaschini, C., Geelhaar, L., Aschenbrenner, T., Lazarev, S., Grigoriev, D., Pietsch, U. and Baumbach, T.

Journal of Synchrotron Radiation (22) 67-75


Philipp Schroth, Martin Köhl, Jean-Wolfgang Hornung, Emmanouil Dimakis, Claudio Somaschini, Lutz Geelhaar, Andreas Biermanns, Ullrich Pietsch, Sondes Bauer, Sergey Lazarev, and Tilo Baumbach

Phys. Rev. Lett. 114, 055504

T. Slobodskyy, P. Schroth, A. Minkevich, D. Grigoriev, E. Fohtung, M. Riotte, T. Baumbach, M. Powalla, U. Lemmer, A. Slobodskyy Journal of Physics D: Applied Physics 46, 475104 2013
M. Köhl, P. Schroth, A. A. Minkevich, T. Baumbach Optics Express 21, 27734-27749 2013

P. Schroth, T. Slobodskyy, D. Grigoriev, A. Minkevich, M. Riotte, S. Lazarev, E. Fohtung, D.Z. Hu, D.M.
Schaadt, T. Baumbach

Materials Science and Engineering B 177 (2012) 721-724 2012

M. Helfrich, P. Schroth, D. Grigoriev, S. Lazarev, R. Felici, T. Slobodskyy, T. Baumbach, und D. M. Schaadt

Physica Status Solidi (A) 209, 2387–2401

T. Slobodskyy, P. Schroth, D. Grigoriev, A. A. Minkevich, D. Z. Hu, D. M. Schaadt, und T. Baumbach

Review of Scientific Instruments 83 (2012) 105112 2012