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Soft X-Ray Emission Electron Microscopy: Chemical State Microscopy from Interface and Bulk

Soft X-Ray Emission Electron Microscopy: Chemical State Microscopy from Interface and Bulk
Authors: A. Zimina, D. R. Batchelor, S. Eisebitt, D. Schmeisser, A. Shulakov, W. Eberhardt
Source: Surface and Interface Analysis 40 (2008) 958-960
Date: 2008