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New Dimensions in Synchrotron Infrared Spectroscopy and Imaging: Spectro-Microtomography and Broadband Vibrational Nanospectroscopy

New Dimensions in Synchrotron Infrared Spectroscopy and Imaging: Spectro-Microtomography and Broadband Vibrational Nanospectroscopy
place:new ANKA seminar room, building 348, 2nd floor
Affiliation:Advanced Light Source, Berkeley Lab, USA
Date:01.04.2014
Inviting person:Yves-Laurent Mathis, KIT-ANKA
Speaker:Michael C. Martin
Time:11:00 a.m.

Abstract:

Synchrotron infrared beamlines use the diffraction-limited beam properties to enable a variety of cutting edge science - how can we go further? I will describe two new techniques we have recently demonstrated.  First, 3D FTIR tomography [1] provides spectrally rich, label-free, nondestructive visualizations of distinctive chemical compositions throughout intact biological or materials samples. And Synchrotron Infrared Nano Spectroscopy (SINS) [2] couples the synchrotron infrared beam to the tip of an atomic force microscope (AFM) to measure very broadband (700 - 6000 cm-1) spectra from a spot only ~20 nm in size [2].
 
[1] Martin et al., Nature Methods, 10, 861-864 (2013).
[2] Bechtel et al., PNAS, under review (2014).