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Growth and structure characterization of EuSi2 films and nanoislands on vicinal Si(001) surface

Growth and structure characterization of EuSi2 films and nanoislands on vicinal Si(001) surface
Authors:

A. Seiler, O. Bauder, S. Ibrahimkutty, R. Pradip, T. Prüßmann, T. Vitova, M. Fiederle, T. Baumbach, and S. Stankov

Source:

Journal of Crystal Growth 407, 74-77

Date: 2014