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NANO beamline

nano Beamline

NANO at ANKA is a State of the Art beamline specialized for high-resolution x-ray diffraction, surface and interface X-ray scattering investigation.

The main applications:

  • Thin films and multilayers
  • Surfaces and interfaces
  • Nanostructures (2D and 3D) and nanomaterials
  • Real-Time Monitoring of growing Epitaxial thin film, Superlattice and Nano-particles
  • Characterization of shape, size, position and their correlations in nanostructures
  • Defect analysis in crystal structures
  • In-situ and ex-situ growth studies of crystals, organic and inorganic films

NANO Beamline


name title function area of activity e-mail
Dr. Beamline Scientist - NANO Hard X-ray Scattering sondes bauerRsz6∂kit edu

Nano applications

Methods and apllications at NANO beamline:

NANO Methoden


NANO Applications


NANO Instrumentation    

Title Author Source Date Link
S. Bauer, S. Lazarev, A. Molinari, A. Breitenstein, P. Leufke, R. Kruk, H. Hahn, T. Baumbach Journal of Synchrotron Radiation 21, 386–394 2014


S. Lazarev, S. Bauer, T. Meisch, M. Bauer, I. Tischer, M. Barchuk, K. Thonke, V. Holy, F. Scholz, T. Baumbach

Journal of Applied Crystallography 46, 1425-1433



S. Lazarev, S. Bauer, K. Forghani, M. Barchuk, F. Scholz, T. Baumbach Journal of Crystal Growth  370,


S. Lazarev, M. Barchuk, S. Bauer, V. Forghani, V. Holý, F. Scholz, T. Baumbach Journal of Applied Crystallography  46,


F. Scholz, K. Forghani, M. Klein, O. Klein, U. Kaiser, B. Neuschl, I. Tischer, M. Feneberg, K. Thonke, S. Lazarev, S. Bauer, T.Baumbach Japanese Journal of Applied Physics 52, 08JJ07 2013


T. Slobodskyy, P. Schroth, D. Grigoriev, A. A. Minkevich, D. Z. Hu, D. Schaadt, T. Baumbach 

Review of Scientific Instruments 83 (2012) 105112-105117 

2012 PDF

S. Casalbuoni, T. Baumbach, S. Gerstl, A. Grau, M. Hagelstein, T. Holubek, D. Saez de Jauregui, C. Boffo, W. Walter 

Synchrotron Radiation News 24 (2011) 14-19 

A. Rack, H. Riesemeier, P. Vagovic, T. Weitkamp, F. Siewert, R. Dietsch, W. Diete, S. Bauer Trabelsi, T. Waterstradt, T. Baumbach AIP Conference Proceedings 1234, 740-743 2010