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High resolution synchrotron X-ray studies of phase separation phenomena and the scaling law for the threading dislocation densities reduction in high quality AIGaN heterostructure

High resolution synchrotron X-ray studies of phase separation phenomena and the scaling law for the threading dislocation densities reduction in high quality AIGaN heterostructure
Authors: S. Lazarev, S. Bauer, K. Forghani, M. Barchuk, F. Scholz, T. Baumbach
Source: Journal of Crystal Growth  370,
51-56
Date: 2013