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Minimization of spurious strains by using a Si bent-perfect-crystal monochromator: neutron surface strain scanning of a shot-peened sample

Minimization of spurious strains by using a Si bent-perfect-crystal monochromator: neutron surface strain scanning of a shot-peened sample
Authors:

J. Rebelo Kornmeier, J. Gibmeier, M. Hofmann 

Source:

Measurement Science and Technology 22 (2011) 065705-1-9 

Date: 2011