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Grazing-incidence x-ray diffraction from GaN epitaxial layers with threading dislocations

Grazing-incidence x-ray diffraction from GaN epitaxial layers with threading dislocations
Authors:

M. Barchuk, V. Holy, B. Miljevic, B. Krause, T. Baumbach 

Source:

Applied Physics Letters 98 (2011) 021912-1-3 

Date: 2011