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High resolution synchrotron X-ray studies of phase separation phenomena and the scaling law for the threading dislocation densities reduction in high quality AIGaN heterostructure

High resolution synchrotron X-ray studies of phase separation phenomena and the scaling law for the threading dislocation densities reduction in high quality AIGaN heterostructure
Authors:

S. Lazarev, S. Bauer, K. Forghani, M. Barchuk, F. Scholz, T. Baumbach

Source:

Journal of Crystal Growth 370, 51-56

Date: 2013