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SXRT investigations on electrically stressed 4H-SiC PiN diodes for 6.5 kV

SXRT investigations on electrically stressed 4H-SiC PiN diodes for 6.5 kV
Authors:

B. Kallinger, P. Berwian, J. Friedrich, C. Hecht, D. Peters, P. Friedrichs, B. Thomas 

Source:

Materials Science Forum 740-742, 899-902 

Date: 2013