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Small-angle subgrain boundaries emanating from dislocation pile-ups in multicrystalline silicon studied with synchrotron white-beam X-ray topography

Small-angle subgrain boundaries emanating from dislocation pile-ups in multicrystalline silicon studied with synchrotron white-beam X-ray topography
Authors:

D. Oriwol, E.-R. Carl, A. N. Danilewsky, L. Sylla, W. Seifert, M. Kittler, H. S. Leipner 

Source:

Acta Materialia 61, 6903-6910 

Date: 2013