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Investigation of the luminescence, crystallographic and spatial resolution properties of nLSO:Tb scintillating layers used for X-ray imaging applications

Investigation of the luminescence, crystallographic and spatial resolution properties of nLSO:Tb scintillating layers used for X-ray imaging applications
Authors:

A. Cecilia, V. Jary, M. Nikl, E. Mihokova, D. Hänschke, E. Hamann, P.-A. Douissard, A. Rack, T. Martin, B. Krause, T. Baumbach, M. Fiederle 

Source:

Radiat. Meas. DOI: 10.1016/j.radmeas.2013.12.005 

Date: 2014