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Characteristics

Energy range  [3keV – 25 keV]
 Source  Superconductiong undulator SCU15, B = 0.8 T, deflection parameter Kmax = 1.12 tuneable electrically and could be operated with magnetic gaps: 8 mm/5.4 mm
 Optics  - two horizontally collimating/focusing mirrors with variable benders
- two vertically collimating/focusing mirrors with variable benders
- Double crystal monochromator equipped with two pairs of crystals (Si111 & Si311)
- Double multilayer monochromator equipped with two pairs of multilayers (NiB4C and Mo/B4C).
- Four slits used partially to protect the mirrors from the overfilling.
- Diagnostic elements: 2 Profile monitors, 4 Fluorescence screens, 2 Intensity monitors, ionisation chamber and polarisation monitor.
 Energy Resolution (ΔE/E)  ΔE/E=10-2 : Multilayer Ni/B4C, bi-layer number N=150, dspacing=3.05 nm
ΔE/E=10-2: Multilayer Pd/B4C, bi-layer number N=160, dspacing=2.9 nm
ΔE/E=10-3: Multilayer Mo/B4C, bi-layer number N=500, dspacing=1.5 nm
ΔE/E=10-3: Multilayer Pd/B4C, bi-layer number N=500, dspacing=1.5 nm
ΔE/E=10-4: Crystal monochromator Si111, Si311.
 Beam characteristics in focused mode at sample   Beam size (HxV) [FWHM] = 145 µm x 37.4 µm
 Beam divergence (HxV) [FWHM] = 0.28 x 0.073 mrad = 0.016 x 0.0042 deg
 → Monochromatic mode (ΔE/E=10-4): Flux density @8 keV@K=0.95=3.2*1013Ph/s/mm2/100mA 
 → DMM mode (ΔE/E=2.8*10-3): Flux density @8 keV@K=0.95= 3.7*1014 Ph/s/mm2/100mA
using Multilayer Mo/B4C, bi-layer number N=500, dspacing=1.5 nm
 → DMM mode (ΔE/E=10-2): Flux density @8 keV@K=0.95= 2.7*1015 Ph/s/mm2/100 mA
using Multilayer Ni/B4C, bi-layer number N=150, dspacing=3.05 nm.
 Beam characteristics in collimated mode at sample Beam size (HxV) [FWHM]: 2mm x 0.74 mm
Beam divergence (HxV) [FWHM]= 0.02 mrad x 0.0037 mrad=0.001x0.0002 deg
 → Monochromatic mode ΔE/E=10-4):Total Flux @8 keV@K=0.95=1.42 1012Ph/s/100 mA 
 → DMM mode (ΔE/E=2.8*10-3): Total Flux @8 keV@K=0.95=1.72 1013Ph/s/100mA
using Multilayer Mo/B4C, bi-layer number N=500, dspacing=1.5 nm
 → DMM mode (ΔE/E=10-2): Total Flux@8 keV@K=0.95=1.2 1014Ph/s/100 mA
using Multilayer Ni/B4C, bi-layer number N=150, dspacing=3.05 nm
 Experimental Setup  Diffractometer configuration A with an Euler cradle.
 Here the diffractometer can be used in horizontal and vertical geometries. It offers a large incidence angle range Θ=0°–50 °, and it is suited for baby chambers up to 25 kg and sizes up to (36 x 36 x 40) cm³.
 Diffractometer configuration B with a heavy duty sample tower.
In this configuration the diffractometer can be used in horizontal geometry and is suited for grazing incidence angles μ = [-5°–5 °]. It is suited for heavy environmental chambers up 500 kg and the size of the platform of the holder will be (245 x 245) mm².
 Diffractometer configuration C.
This is a combination auf two smaller setups for a fast change between vertical and horizontal geometries. It is suited to handle moderate environmental chambers up to 50 kg.
 Detector systems:
- Cyberstar NaI point detector with 38 mm detection area, dynamic range of 107, read-out 1µsec, count rate 106 and dark noise < 0.2 cps @ 5 keV.
- Avalanche photodiode APD: 10 x 10 mm detection area, read-out 1µsec, count rate 108 and dark noise < 1 cps.
- Linear detector: Hecus PSD-50M with 50 mm windows length, read-out 10µsec, count rate 105 and dark noise < 10-5 cps/channel
- X-ray eye: TBA
- Energy dispersive detector: Vortex-60EX w/XIA Saturn-ALL electronic
- CCD detector: TBA