Home | Legals | Sitemap | KIT

Microstructural investigation of Cement-based materials and the benefit of the application of synchrotron techniques

Microstructural investigation of Cement-based materials and the benefit of the application of synchrotron techniques
place:new ANKA seminar room, building 348, 2nd floor
Affiliation:School of Materials Science and Engineering, Tongji Universty, Shanghai, China
Date:29.01.2014
Inviting person:Yin Cheng, KIT-IPS
Speaker:Xianping Liu
Time:11:00 a.m.

Abstract:

The understanding of the microstructure development of cement-based materials is the central issue about the application of cements to achieve high level of performance. Although large number of conventional experimental techniques is available to obtain information about the microstructure properties during the hydration process, there are still limitations in providing full description of all characteristics quantitatively and spatially. This talk will focus on imaging and diffraction techniques used in the research of cement-based materials and the benefits of the application of synchrotron radiation techniques. X-ray microtomography, X-ray laminography, coherent X-ray diffraction imaging and XRD/Rietveld methods and some applications will be described in detail.