Accelerator Test Facility and Synchrotron Radiation Source at KIT

X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions

  • Authors:

    C. Ferrari, F. Germini, D. Korytár, P. Mikulík, L. Peverini 

  • Source:

    Journal of Applied Crystallography 44 (2011) 353-358 

  • Date: 2011