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A portable ultrahigh vacuum organic molecular beam deposition system for in situ x-ray diffraction measurements

A portable ultrahigh vacuum organic molecular beam deposition system for in situ x-ray diffraction measurements
Authors:

K. A. Ritley, B. Krause, F. Schreiber, H. Dosch 

Source:

Review of Scientific Instruments 72 (2), 1453-1457 

Date: 2001