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Polytypism in GaAs nanowires: Determination of the interplanar spacing of wurtzite GaAs by X-ray diffraction

Polytypism in GaAs nanowires: Determination of the interplanar spacing of wurtzite GaAs by X-ray diffraction
Authors:

M. Köhl, P. Schroth, A. A. Minkevich, J.-W. Hornung, E. Dimakis, C. Somaschini, L. Geelhaar, T. Aschenbrenner, S. Lazarev, D. Grigoriev, U. Pietsch, T. Baumbach,

Source:

J. Synchrotron Rad. 22, 67

Date: 2015