	Philipp Schroth
	PhD Students Molecular beam epitaxy and X-ray scattering Focus of research: : III/V Nanowires – Growth dynamics and Polytypism in self-catalyzed GaAs Nanowires grown on Silicon philipp schrothOaw6∂kit edu	Group: Nanocharacterization

Dipl.-Phys. Philipp Schroth

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Research interests

MBE growth of III/V nanowires and III/V quantum dots
Polytypism in III/V nanowires
X-ray diffraction of nanostructures
FEM calculations of material specific strains in epitaxial semiconductor nanostructures

Professionel Curriculum

since 2011 KIT

Education/Qualifications

2011 Diplom at KIT

Winner of the "YIN Poster Award 2013"

Title: In-situ monitoring of the growth process of self-catalyzed GaAs nanowires on Si (111) with X-ray diffraction P. Schroth, M. Köhl, E. Dimakis, C. Somaschini, L. Geelhaar, J.-W. Hornung, S. Lazarev, S. Bauer, A. Biermanns, U. Pietsch, and T. Baumbach

Publications
Author	Title	Source	Date
Philipp Schroth, Martin Köhl, Jean-Wolfgang Hornung, Emmanouil Dimakis, Claudio Somaschini, Lutz Geelhaar, Andreas Biermanns, Ullrich Pietsch, Sondes Bauer, Sergey Lazarev, and Tilo Baumbach	Evolution of polytypism in GaAs nanowires during growth revealed by time-resolved in situ x-ray diffraction	Phys. Rev. Lett. 114, 055504	2015
Köhl, M., Schroth, P., Minkevich, A. A., Hornung, J.-W., Dimakis, E., Somaschini, C., Geelhaar, L., Aschenbrenner, T., Lazarev, S., Grigoriev, D., Pietsch, U. and Baumbach, T.	Polytypism in GaAs nanowires: determination of the interplanar spacing of wurtzite GaAs by X-ray diffractionArtikel 5336	Journal of Synchrotron Radiation (22) 67-75	2015
M. Köhl, P. Schroth, A. A. Minkevich, T. Baumbach	Retrieving the displacement of strained nanoobjects: the impact of bounds for the scattering magnitude in direct space	Optics Express 21, 27734-27749	2013
T. Slobodskyy, P. Schroth, A. Minkevich, D. Grigoriev, E. Fohtung, M. Riotte, T. Baumbach, M. Powalla, U. Lemmer, A. Slobodskyy	Three-dimensional reciprocal space profile of an individual nanocrystallite inside a thin-film solar cell absorber layer	Journal of Physics D: Applied Physics 46, 475104	2013
M. Helfrich, P. Schroth, D. Grigoriev, S. Lazarev, R. Felici, T. Slobodskyy, T. Baumbach, und D. M. Schaadt	Growth and characterization of site-selective quantum dots	Physica Status Solidi (A) 209, 2387–2401	2012
P. Schroth, T. Slobodskyy, D. Grigoriev, A. Minkevich, M. Riotte, S. Lazarev, E. Fohtung, D.Z. Hu, D.M. Schaadt, T. Baumbach	Investigation of buried quantum dots using grazing incidence X-ray diffraction	Materials Science and Engineering B 177 (2012) 721-724	2012
T. Slobodskyy, P. Schroth, D. Grigoriev, A. A. Minkevich, D. Z. Hu, D. M. Schaadt, und T. Baumbach	A portable molecular beam epitaxy system for in situ x-ray investigations at synchrotron beamlines	Review of Scientific Instruments 83 (2012) 105112	2012