Home | Legals | Sitemap | KIT

Polytypism in GaAs nanowires: determination of the interplanar spacing of wurtzite GaAs by X-ray diffraction

Polytypism in GaAs nanowires: determination of the interplanar spacing of wurtzite GaAs by X-ray diffraction
Authors:

M. Köhl, P. Schroth, A. A. Minkevich, J.-W. Hornung, E. Dimakis, C. Somaschini, L. Geelhaar, T. Aschenbrenner, S. Lazarev, D. Grigoriev, U. Pietsch and T. Baumbach

Source:

Journal of Synchrotron Radiation 22, Part 1

Date: 2015