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Beamlines

ANKA-Beamlines

IR/THz, UV & Soft X-ray Spectroscopy

IR1

IR2

UV-CD12

WERA

X-SPEC

 

Hard X-ray Spectroscopy

CAT-ACT

CAT-ACT

FLUO

INE

SUL-X

XAS

 

X-ray Lithography

LIGA I

LIGA II

LIGA III

 

Hard X-ray Imaging

IMAGE

TOPO-TOMO

 

Hard X-ray Scattering

MPI

NANO

PDIFF

SCD

 

 

 

 

Beamline Scientific application Experimental station Specification Source Status
FLUO X-ray fluorescence analysis (XRF), x-ray fluorescence microprobe (μ-XRF), total x-ray reflection fluorescence (TXRF) Vacuum chamber, SiLi-detector Energy range:
1 - 30 keV
Resolution:
2x10-2 ΔE/E
Bending magnet Operational
INE Spectroscopy of actinide samples Ionization chambers, 4 element Vortex SSD detector, Vortex EX-60 SSD detector, 4 axis goniometer for GI-XAFS, Huber sample positioning system Energy range: 2.1 - 25 keV
Resolution:
2x10-4 ΔE/E
Bending magnet Operational
IR1 Infrared/THz spectroscopy, ellipsometry FTIR spectrometer and ellipsometer, liquid He cryostat Spectral range:
4 - 10000 cm-1
Resolution:
0.1 cm-1
Bending magnet edge Operational
IR2 Infrared/THz spectroscopy, microscopy and imaging FTIR spectrometer and microscope, liquid He cryostat, heating stage Spectral range:
4 - 10000 cm-1
Resolution:
0.1 cm-1
Bending magnet edge Operational
LIGA I Mask fabrication, patterning of thin microstructures Scanner Energy range: 2.2 - 3.3 keV Bending magnet Operational
LIGA II Deep x-ray lithography Scanner Energy range:
2.5 - 12.4 keV
Bending magnet Operational
LIGA III Ultra deep x-ray lithography Scanner Energy range:
2.5 - 15.0 keV
Bending magnet Operational
MPI Surface diffraction 1st station:
Multiple circle diffractometer, horizontal / vertical sample normal geometry, horizontal / vertical four circle geometry, COR 5 m from DCM
2nd station:
horizontal six circle diffractometer, COR 10 m from DCM
Energy range:
6 keV - 20 keV
Resolution:
3 10-4 @ 9 keV
Bending magnet Operational
PDIFF X-ray powder diffraction (XRPD), roentgenography, single-crystal diffraction 4+2 circle diffractometer Energy range:
6 - 20 keV
Resolution:
2x10-4 ΔE/E
Bending magnet Operational
SCD Single crystal diffraction, single / multiple anomalous dispersion (SAD/MAD) 3 axis diffractometer with CCD-detector and 2 axis diffractometer with image plate detector Energy range:
4 - 20 keV
Resolution: 3.5x10-4 ΔE/E
Bending magnet Operational
SUL-X X-ray diffraction (XRD), fluorescence analysis (XRF) and x-ray absorption spectroscopy in µ-focus  Vacuum chamber, ionization chambers, 7 element SiLi-detector, 3.5 axis diffractometer + CCD  Energy range: 2.3 (1.5) - 20 keV
Resolution:
2x10-4 ΔE/E
 Wiggler Operational
TOPO-
TOMO
X-ray microtomography and radiography, x-ray white-light topography 4 axis goniometer, high-resolution tomography sample stage, medium and high-resolution imaging detectors Energy range:
10-30 keV
Bandwidth: white beam or (from 2008)
ΔE/E≈ 10-2
Bending magnet

TOPO:
Operational

TOMO:
Under Construction

UV-CD12 VUV / UV circular dichroism spectroscopy, oriented circular dichroism (OCD) Modular CD spectropolarimeter, N2-purged sample chambers for liquid and solid-state samples

Spectral range: 120-350 nm

Wavelength resolution: 0.5-2.0 nm

Bending magnet
(1.5 T)
Operational
WERA Soft x-ray spectroscopy and microscopy, photoemission, absorption, SXMCD PEEM, 4-element fluorescence detector, electron energy analyzer, sample cryostat, thin-film and sample preparation incl. pulsed laser deposition, UHV sample transfer Energy range:
100 - 1500 eV
Resolution: up to 1x 10-4 ΔE/E
Bending magnet (and undulator) Operational
XAS Extended x-ray absorption fine structure (EXAFS), x-ray absorption near edge fine structure (XANES), Q-EXAFS Ionization chambers, 5 element Ge detector, closed cycle He cryostat, 4 axis goniometer for GI-XAFS Energy range: 2.3 - 25 keV
Resolution:
2x10-4 ΔE/E
Bending magnet Operational
Beamline Scientific application Experimental station Specification Source Status
CAT-ACT       Wiggler

Operational

CAT-ACT Spectroscopy of actinide samples Ionization chambers, 5 element Ge detector, Ketek 1 element SDD, Huber sample positioning stage(z,x,y,phi), HRXES Johann Spectrometer Energy range: 3.4 - 55 keV
Resolution:
n.d. ΔE/E
Wiggler Operational
IMAGE Radiography and tomography Ultra-precise sample manipulator; automatic sample changer system. 2D detector system; energy-dispersive detector Energy range:
7 - 65 keV
Resolution:
10-2 - 10-4 ΔE/E
Super-
conducting combined wiggler / undulator
Operational
NANO X-ray diffraction (HR-XRD) with highest angular resolution, anomalous scattering, coherent scattering (1) High-resolution 6-circle diffractometer; (2) heavy-duty diffractometer; MBE chamber, cryostats, superconducting magnet Energy range:
3 - 30 keV
Resolution:
2·10-4 - 10-2 ΔE/E   
Super-
conducting undulator
Operational
X-SPEC Soft and hard X-ray spectroscopy     Super-
conducting undulator
Under Construction