Beamlines
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IR/THz, UV & Soft X-ray Spectroscopy
Hard X-ray Spectroscopy CAT-ACT CAT-ACT
X-ray Lithography
Hard X-ray Imaging
Hard X-ray Scattering
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Beamline | Scientific application | Experimental station | Specification | Source | Status |
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FLUO | X-ray fluorescence analysis (XRF), x-ray fluorescence microprobe (μ-XRF), total x-ray reflection fluorescence (TXRF) | Vacuum chamber, SiLi-detector | Energy range: 1 - 30 keV Resolution: 2x10-2 ΔE/E |
Bending magnet | Operational |
INE | Spectroscopy of actinide samples | Ionization chambers, 4 element Vortex SSD detector, Vortex EX-60 SSD detector, 4 axis goniometer for GI-XAFS, Huber sample positioning system | Energy range: 2.1 - 25 keV Resolution: 2x10-4 ΔE/E |
Bending magnet | Operational |
IR1 | Infrared/THz spectroscopy, ellipsometry | FTIR spectrometer and ellipsometer, liquid He cryostat | Spectral range: 4 - 10000 cm-1 Resolution: 0.1 cm-1 |
Bending magnet edge | Operational |
IR2 | Infrared/THz spectroscopy, microscopy and imaging | FTIR spectrometer and microscope, liquid He cryostat, heating stage | Spectral range: 4 - 10000 cm-1 Resolution: 0.1 cm-1 |
Bending magnet edge | Operational |
LIGA I | Mask fabrication, patterning of thin microstructures | Scanner | Energy range: 2.2 - 3.3 keV | Bending magnet | Operational |
LIGA II | Deep x-ray lithography | Scanner | Energy range: 2.5 - 12.4 keV |
Bending magnet | Operational |
LIGA III | Ultra deep x-ray lithography | Scanner | Energy range: 2.5 - 15.0 keV |
Bending magnet | Operational |
MPI | Surface diffraction | 1st station: Multiple circle diffractometer, horizontal / vertical sample normal geometry, horizontal / vertical four circle geometry, COR 5 m from DCM 2nd station: horizontal six circle diffractometer, COR 10 m from DCM |
Energy range: 6 keV - 20 keV Resolution: 3 10-4 @ 9 keV |
Bending magnet | Operational |
PDIFF | X-ray powder diffraction (XRPD), roentgenography, single-crystal diffraction | 4+2 circle diffractometer | Energy range: 6 - 20 keV Resolution: 2x10-4 ΔE/E |
Bending magnet | Operational |
SCD | Single crystal diffraction, single / multiple anomalous dispersion (SAD/MAD) | 3 axis diffractometer with CCD-detector and 2 axis diffractometer with image plate detector | Energy range: 4 - 20 keV Resolution: 3.5x10-4 ΔE/E |
Bending magnet | Operational |
SUL-X | X-ray diffraction (XRD), fluorescence analysis (XRF) and x-ray absorption spectroscopy in µ-focus | Vacuum chamber, ionization chambers, 7 element SiLi-detector, 3.5 axis diffractometer + CCD | Energy range: 2.3 (1.5) - 20 keV Resolution: 2x10-4 ΔE/E |
Wiggler | Operational |
TOPO- TOMO |
X-ray microtomography and radiography, x-ray white-light topography | 4 axis goniometer, high-resolution tomography sample stage, medium and high-resolution imaging detectors | Energy range: 10-30 keV Bandwidth: white beam or (from 2008) ΔE/E≈ 10-2 |
Bending magnet |
TOPO: |
UV-CD12 | VUV / UV circular dichroism spectroscopy, oriented circular dichroism (OCD) | Modular CD spectropolarimeter, N2-purged sample chambers for liquid and solid-state samples |
Spectral range: 120-350 nm Wavelength resolution: 0.5-2.0 nm |
Bending magnet (1.5 T) |
Operational |
WERA | Soft x-ray spectroscopy and microscopy, photoemission, absorption, SXMCD | PEEM, 4-element fluorescence detector, electron energy analyzer, sample cryostat, thin-film and sample preparation incl. pulsed laser deposition, UHV sample transfer | Energy range: 100 - 1500 eV Resolution: up to 1x 10-4 ΔE/E |
Bending magnet (and undulator) | Operational |
XAS | Extended x-ray absorption fine structure (EXAFS), x-ray absorption near edge fine structure (XANES), Q-EXAFS | Ionization chambers, 5 element Ge detector, closed cycle He cryostat, 4 axis goniometer for GI-XAFS | Energy range: 2.3 - 25 keV Resolution: 2x10-4 ΔE/E |
Bending magnet | Operational |
Beamline | Scientific application | Experimental station | Specification | Source | Status |
CAT-ACT | Wiggler |
Operational |
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CAT-ACT | Spectroscopy of actinide samples | Ionization chambers, 5 element Ge detector, Ketek 1 element SDD, Huber sample positioning stage(z,x,y,phi), HRXES Johann Spectrometer | Energy range: 3.4 - 55 keV Resolution: n.d. ΔE/E |
Wiggler | Operational |
IMAGE | Radiography and tomography | Ultra-precise sample manipulator; automatic sample changer system. 2D detector system; energy-dispersive detector | Energy range: 7 - 65 keV Resolution: 10-2 - 10-4 ΔE/E |
Super- conducting combined wiggler / undulator |
Operational |
NANO | X-ray diffraction (HR-XRD) with highest angular resolution, anomalous scattering, coherent scattering | (1) High-resolution 6-circle diffractometer; (2) heavy-duty diffractometer; MBE chamber, cryostats, superconducting magnet | Energy range: 3 - 30 keV Resolution: 2·10-4 - 10-2 ΔE/E |
Super- conducting undulator |
Operational |
X-SPEC | Soft and hard X-ray spectroscopy | Super- conducting undulator |
Under Construction |