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NANO beamline

nano Beamline

NANO at ANKA is a State of the Art beamline specialized for high-resolution x-ray diffraction, surface and interface X-ray scattering investigation.


The main applications:

  • Thin films and multilayers
  • Surfaces and interfaces
  • Nanostructures (2D and 3D) and nanomaterials
  • Real-Time Monitoring of growing Epitaxial thin film, Superlattice and Nano-particles
  • Characterization of shape, size, position and their correlations in nanostructures
  • Defect analysis in crystal structures
  • In-situ and ex-situ growth studies of crystals, organic and inorganic films

NANO Beamline




 

Team NANO
name title function area of activity e-mail
Dr. Beamline Scientist - NANO Hard X-ray Scattering sondes bauerXxd9∂kit edu

Nano applications

Methods and apllications at NANO beamline:
 

NANO Methoden

 

NANO Applications

 

NANO Instrumentation    

Publications
Title Author Source Date Link
S. Bauer, S. Lazarev, A. Molinari, A. Breitenstein, P. Leufke, R. Kruk, H. Hahn, T. Baumbach Journal of Synchrotron Radiation 21, 386–394 2014

PDF

S. Lazarev, S. Bauer, T. Meisch, M. Bauer, I. Tischer, M. Barchuk, K. Thonke, V. Holy, F. Scholz, T. Baumbach

Journal of Applied Crystallography 46, 1425-1433

2013

PDF

S. Lazarev, S. Bauer, K. Forghani, M. Barchuk, F. Scholz, T. Baumbach Journal of Crystal Growth  370,
51-56
2013

PDF

S. Lazarev, M. Barchuk, S. Bauer, V. Forghani, V. Holý, F. Scholz, T. Baumbach Journal of Applied Crystallography  46,
120-127
2013

PDF

F. Scholz, K. Forghani, M. Klein, O. Klein, U. Kaiser, B. Neuschl, I. Tischer, M. Feneberg, K. Thonke, S. Lazarev, S. Bauer, T.Baumbach Japanese Journal of Applied Physics 52, 08JJ07 2013

PDF

T. Slobodskyy, P. Schroth, D. Grigoriev, A. A. Minkevich, D. Z. Hu, D. Schaadt, T. Baumbach 

Review of Scientific Instruments 83 (2012) 105112-105117 

2012 PDF

S. Casalbuoni, T. Baumbach, S. Gerstl, A. Grau, M. Hagelstein, T. Holubek, D. Saez de Jauregui, C. Boffo, W. Walter 

Synchrotron Radiation News 24 (2011) 14-19 

2011
A. Rack, H. Riesemeier, P. Vagovic, T. Weitkamp, F. Siewert, R. Dietsch, W. Diete, S. Bauer Trabelsi, T. Waterstradt, T. Baumbach AIP Conference Proceedings 1234, 740-743 2010