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Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging

Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging
Authors: N. Danilewsky, J. Wittge, A. Croell, D. Allen, P. McNally, P. Vagovic, T. dos Santos Rolo, Z. Li, T. Baumbach, E. Gorostegui-Colinas, J. Garagorri, M. R. Elizalde, M. C. Fossati, D. K. Bowen, B. K. Tanner
Source: Journal of Crystal Growth 318 (2011) 1157-1163
Date: 2011