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Spatially resolved XRF, XAFS, XRD, STXM and IR investigation of a natural U-rich clay

Spatially resolved XRF, XAFS, XRD, STXM and IR investigation of a natural U-rich clay
Authors: M. A. Denecke, P. Michel, T. Schäfer, F. Huber, K. Rickers, J. Rothe, K. Dardenne, B. Brendebach, T. Vitova, M. Elie
Source: Journal of Physics: Conference Series 190, 12187
Date: 2009