LIGA uses deep X-ray lithography with synchrotron radiation for the production of high aspect ratio polymer microstructures. By shadow printing an X-ray mask is copied into an X-ray sensitive resist. A chemical developer dissolves the irradiated areas. Free lateral shape, structures heights from 20 µm up to several millimetres, vertical sidewalls with optical quality (Ra < 20 nm) and sub µm structure details are the basic characteristics of this process step.
The whole laboratory is placed inside a clean room for accurate environment conditions. The experimental equipment, together with the microstructure fabrication capabilities at IMT/FZK, is a unique installation for high precision and high aspect ratio microstructure fabrication. Even the resist preparation, development and optional electroformimg process is done by using the clean room capabilities and expertise of IMT.
The microstructure laboratory at ANKA consists of three beamlines for deep x-ray lithography, each dedicated to a specific task in the LIGA-process. In this chapter we present the LIGA1 beamline, dedicated to high resolution X-ray mask making and thin film X-ray lithography (XRL). The typical data for the structural height is up to 100 microns with a smallest width of 5 µm. Smaller line widths as well as thinner structures are design dependent and therefore under further development according to the demands of the micro/nano interface.
name | titel | function | ||
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Pantenburg, Franz-Josef | Dr. | X-ray lithography | franz-josef pantenburgNdu1∂kit edu |
Börner, Martin | Dr. | X-ray lithography | martin boernerRwe9∂kit edu |
Energy range
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2.2 - 3.3 keV
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Source
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1.5 T Bending magnet, bending radius: 5.556 m
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Be-window
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175 µm
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Mirror
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Si/200nm Cr @ 15.4 mrad
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Distance: source point-mask plane
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14.84 m
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Distance: source point -mirror
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8,61 m
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Be-window aperture
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20 mm (vertical) x 110 mm (horizontal) |
Usable horizontal fan
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108 mm
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Sample environment
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100 mbar He
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Experimental setup
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JenOptik Dex02 X-ray scanner with tilting option (+/- 60°) and rotation option (362°)
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Alignment / instrumental overlay accuracy
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Internal, 0,5 µm
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Title | Author | Source | Date | Link |
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Mosaic-like micropillar array for hard x-ray focusing—one-dimensional version |
V. Nazmov, J. Mohr, R. Simon |
J. Micromech. Microeng. 23, 095015 |
2013 | |
Fabrication techniques for multiscale 3D-MEMS with vertical metal micro- and nanowire integration | F. Greiner, S. Quednau, F. Dassinger, R. Sarwar, H. F Schlaak, M. Guttmann, P. Meyer | Journal of Micromechanics and Microengineering 23, 025018 | 2013 | |
Highly precise micro-retroreflector array fabricated by the LIGA process and its application as tapped delay line filter |
M. Bohling, T. Seiler, B. Wdowiak, J. Jahns, J. Mohr, M. Börner |
Applied Optics 51 (2012) 5989-5995 |
2012 | |
Parabolic crossed planar polymeric x-ray lenses |
V. Nazmov, E. Reznikova, J. Mohr, V. Saile, L. Vincze, B. Vekemans, S. Bohic, A. Somogyi |
Journal of Micromechanics and Microengineering 21 (2011) 015020-1-11 |
2011 | |
Polyimide-based X-ray masks with advanced performance of pattern accuracy and thermal stability |
S. Kinuta, Y. Saita, M. Kobayashi, M. Boerner, V. Saile, S. Hosaka |
Microsystem Technologies - Micro- and Nanosystems. Information Storage and processing Systems 16 (2010) 1299-1302 |
2010 |