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X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions

X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions
Authors:

C. Ferrari, F. Germini, D. Korytár, P. Mikulík, L. Peverini 

Source:

Journal of Applied Crystallography 44 (2011) 353-358 

Date: 2011