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Fabrication and Characterization of Analyzer Gratings with High Aspect Ratios for Phase Contrast Imaging Using a Talbot Interferometer

Fabrication and Characterization of Analyzer Gratings with High Aspect Ratios for Phase Contrast Imaging Using a Talbot Interferometer
Authors:

J. Kenntner, V. Altapova, T. Grund, F. J. Pantenburg, J. Meiser, T. Baumbach, J. Mohr 

Source:

AIP Conference Proceedings 1437 (2012) 89-93 

Date: 2012