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Measurement of object height in emission electron microscopy

Measurement of object height in emission electron microscopy
Authors:

F. Schertz, D. Kutnyakhov, S. Schuppler, P. Nagel, S. A. Nepijko, G. Schönhense 

Source:

Applied Physics A: Materials Science & Processing 102 (2011) 253-258 

Date: 2011